首頁/電子材料/GGB Calibration Substrate
瀏覽次數:621by:貝斯科技

GGB Calibration Substrate

Calibration Substrate Selection GuideCalibrationPad Size(mic

#GGB#校正片#probe#50A#ide

產品詢價與合作洽詢

嗨,想詢價或有問題都可以直接寫在下面,不用寫得很正式,我們看得懂就好,留下聯絡方式後,我們會盡快回覆你
驗證碼圖片驗證碼圖片驗證碼圖片驗證碼圖片
為避免垃圾訊息,請協助輸入驗證碼,謝謝您的耐心
To:

聯絡人:簡**

Email:c******@bestt.com.tw

最新洽詢

詢問_超白玻璃片_價格

(林*達)

8740線材檢驗器

(大**療)

晶圆减薄蓝膜和UV TAPE切割蓝膜

(MR*****)

购买氧化铝陶瓷棒

(M***i)

晶圆减薄蓝膜和UV TAPE切割蓝膜

(MR*****)

貝斯科技

公司位置:新竹縣-新埔鎮
統一編號:53131488
公司簡介:貝斯科技為,從事模具及設備製造產業有二十三年經驗team成立,宗旨提供半導體及電子產業
https://073725535.tw66.com.tw/web/NMD?postId=997023各式食品用包裝盒

伸長彩色印刷公司專門生產各式彩盒及紙製品印刷。針對客戶的彩盒需求,我司可提供各種盒型設計、印刷、成型一條龍的服務。

貝斯科技產品

推薦產品

Calibration Substrate Selection Guide
Calibration Pad Size(microns)   Calibration Footprint Pitch Range Pitch Range
Substrate Types Supported Recommeded (µm) Acceptable (µm)
CS-5 50 x 50 SOLT, LRL, LRM GSG 75 - 250 75 - 250
CS-9 100 x 100 SOLT, LRL, LRM GSG 250 - 600 150 - 600
CS-10 150 x 150 SOLT, LRM GSG 600 -1250 225 -1250
CS-18 300 x 300 SOLT, LRM GSG 1250 - 2540 500 - 2540
Figure 2
CS-8 50 x 50 SOLT, LRM GS, SG 50 - 200 50 - 300
100 x 100
150 x 150
CS-14 100 x 100 SOLT, LRM GS, SG 200 - 400 150 - 600
CS-11 150 x 150 SOLT, LRM GS, SG 400 - 1250 175 - 1250
CS-17 300x300 SOLT, LRM GS, SG 750-2540 450-2540
Figure 3
Special Calibration Substrate Designed For Use Above 110 GHz
CS-15 25 x 25 SOLT, LRL, LRM GSG 40 - 150 (SOLT) 40 - 150
30 - 150
(LRL)
Table 3
SOLT = Short-Open-Load-Through
LRL = Line-Reflect-Line (Which is equivalent to TRL = Through-Reflect-Line)
LRM = Line-Reflect-Match (Which is equivalent to TRM = Through-Reflect-Match)
             
Accurate, easy to use calibration substrates, calibration coefficients, and detailed instructions allow you to precisely calibrate the measurement system to the probe tips.  
   
The typical elements for calibrating a microwave measurement system consists of opens, shorts, 50 ohm loads, and throughs. Precision crafted calibration substrates, when properly used, assure you of accurate on-wafer test results.  
   
All load standards are individually inspected and trimmed to within 0.25% accuracy using NIST traceable equipment.  
   
Easy to use step by step instructions are provided for use with Agilent ENA four port network analyzers and Agilent PNA network analyzers with PLTS software.  
Differential Calibration Substrate Selection Guide  
Calibration Pad Size (microns) Calibration Footprint Pitch  
Substrate Types Supported  
CS-2100 50 x 50 SOLT, LRL, LRM GSGSG 100